K. Cota

Neighbor selection for variance reduction in I/sub DDQ/ and other parametric data

W.R. Daasch, K. Cota, James McNames · 2002 · 108 citations

I/sub Ddq/, Other Parametric Data, Engineering +13

Statistical post-processing at wafersort-an alternative to burn-in and a manufacturable solution to test limit setting for sub-micron technologies

R. Madge, Madan M. Rehani, K. Cota et al. · 2003 · 90 citations

Engineering, Industrial Engineering, Mem Testing +23

Variance reduction using wafer patterns in I/sub ddQ/ data

W.R. Daasch, James McNames, Dan Bockelman et al. · 2002 · 77 citations

Engineering, Vlsi Design, Mem Testing +18

An Approach for Selecting Compensation Capacitances in Resonance-Based EV Wireless Power Transfer Systems With Switched Capacitors

K. Cota, Philippe Gray, Mehanathan Pathmanathan et al. · IEEE Transactions on Transportation Electrification · 2019 · 43 citations

Electrical Engineering, Wireless Power Transmission, Power Engineering +9

Identification of systematic yield limiters in complex asics through volume structural test fail data visualization and analysis

Chris Schuermyer, K. Cota, R. Madge et al. · 2006 · 21 citations

Engineering, Mechanical Engineering, Reliability Engineering +16