W.R. Daasch

IC identification circuit using device mismatch

K. Lofstrom, W.R. Daasch, D. Taylor · 2002 · 286 citations

Hardware Security, System On Chip, Hardware Trojan +15

Neighbor selection for variance reduction in I/sub DDQ/ and other parametric data

W.R. Daasch, K. Cota, James McNames · 2002 · 108 citations

I/sub Ddq/, Other Parametric Data, Engineering +13

Statistical post-processing at wafersort-an alternative to burn-in and a manufacturable solution to test limit setting for sub-micron technologies

R. Madge, Madan M. Rehani, K. Cota et al. · 2003 · 90 citations

Engineering, Industrial Engineering, Mem Testing +23

Variance reduction using wafer patterns in I/sub ddQ/ data

W.R. Daasch, James McNames, Dan Bockelman et al. · 2002 · 77 citations

Engineering, Vlsi Design, Mem Testing +18

A thermal-aware superscalar microprocessor

Chee How Lim, W.R. Daasch, George Cai · 2003 · 59 citations

Engineering, Energy Efficiency, Computer Architecture +20