Ritesh Turakhia

In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost

R. Madge, Brady Benware, Ritesh Turakhia et al. · 2005 · 55 citations

Search Optimization, Engineering, Mem Testing +17

Effective and Efficient Test Pattern Generation for Small Delay Defect

Sandeep Goel, Narendra Devta-Prasanna, Ritesh Turakhia · 2009 · 46 citations

Engineering, Mem Testing, Small Delay Defects +18

Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study

Ritesh Turakhia, Sandeep Goel, Brady Benware · 2009 · 26 citations

Engineering, Industrial Engineering, Volume Diagnostics +25

Defect screening using independent component analysis on I/sub DDQ/

Ritesh Turakhia, Brady Benware, R. Madge et al. · 2005 · 22 citations

Anomaly Detection, Engineering, Industrial Engineering +18

Silicon evaluation of longest path avoidance testing for small delay defects

Ritesh Turakhia, W.R. Daasch, John Van Slyke · 2007 · 19 citations

Reliability, Longest Path Avoidance, Reliability Engineering +13