Narendra Devta-Prasanna

Author

Purdue University West Lafayette

Also Known As

N. Devta-Prasanna, N. Devtaprasanna, Narendra Devta-Prasanna

Publications

346

Citations

H-Index

Concepts

All Affiliations

Purdue University West Lafayette University of Iowa LSI Solutions (United States)

About

Narendra Devta-Prasanna is an author at Purdue University West Lafayette specializing in computer engineering, engineering, and software testing.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	8	8	189
2	Computer Engineering	8	8	189
3	Computer Science	3	3	89
4	Education	1	1	17
5	Civil Engineering	1	1	16

Narendra Devta-Prasanna

Publications

189

Citations

H-Index

Page 1

	Year	Citations
Effective and Efficient Test Pattern Generation for Small Delay Defect Sandeep Goel, Narendra Devta-Prasanna, Ritesh Turakhia EngineeringMem TestingSmall Delay DefectsComputer ArchitectureTest Data Generation	2009	46
On the Detectability of Scan Chain Internal Faults An Industrial Case Study Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium EngineeringInspectionIndustrial EngineeringMem TestingVerification	2008	43
Detection of Internal Stuck-open Faults in Scan Chains Fan Yang, S. Chakravarty, Narendra Devta-Prasanna, EngineeringVlsi DesignInternal Stuck-open FaultsMem TestingVerification	2008	25
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems EngineeringScan Test CostMem TestingComputer ArchitectureTest Data Generation	2007	18
Accurate measurement of small delay defect coverage of test patterns Narendra Devta-Prasanna, Sandeep Goel, A. Gunda, EngineeringMeasurementSmall Delay DefectsTest CoverageEducation	2009	17
Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study Sandeep Goel, Narendra Devta-Prasanna Bridge DesignReliability EngineeringEngineeringDppm ImpactPhysical Bridge Defects	2009	16
Improving the Detectability of Resistive Open Faults in Scan Cells Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Defect ToleranceElectrical EngineeringModerate ResistancesFlush TestEngineering	2009	13
Silicon evaluation of faster than at-speed transition delay tests S. Chakravarty, Narendra Devta-Prasanna, A. Gunda, EngineeringVlsi DesignFast_tdf TestsComputer ArchitectureSdd Tests	2012	11

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