Elham Moghaddam

At-speed scan test with low switching activity

Elham Moghaddam, Janusz Rajski, Mark Kassab et al. · 2010 · 78 citations

Engineering, Computer Engineering, Electrical Engineering +17

Embedded Deterministic Test Points

Cesar Acero, D.B.I. Feltham, Yingdi Liu et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2017 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +13

Logic BIST With Capture-Per-Clock Hybrid Test Points

Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2018 · 42 citations

Engineering, Computer Engineering, Computer Systems +13

Embedded deterministic test points for compact cell-aware tests

Cesar Acero, D.B.I. Feltham, Friedrich Hapke et al. · 2015 · 30 citations

Engineering, Bioengineering, Cell Cycle +8

Test point insertion in hybrid test compression/LBIST architectures

Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski et al. · 2016 · 22 citations

Engineering, Computer Engineering, Electrical Engineering +13