Nilanjan Mukherjee

Embedded Deterministic Test

Janusz Rajski, Jerzy Tyszer, Mark Kassab et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2004 · 518 citations

Engineering, Mem Testing, Verification +19

Embedded deterministic test for low cost manufacturing test

J. Rajski, Jerzy Tyszer, Mark Kassab et al. · 2003 · 400 citations

Engineering, Industrial Engineering, Mem Testing +18

Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm

Yu Huang, S.M. Reddy, Wu-Tung Cheng et al. · 2003 · 164 citations

Engineering, Optimal Wrapper Width, Power Optimization (Eda) +21

Resource allocation and test scheduling for concurrent test of core-based SOC design

Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai et al. · 2002 · 145 citations

Engineering, Computer Architecture, Systems Engineering +16

Control of Second-Life Hybrid Battery Energy Storage System Based on Modular Boost-Multilevel Buck Converter

Nilanjan Mukherjee, Dani Strickland · IEEE Transactions on Industrial Electronics · 2014 · 105 citations · Full text

Electrical Engineering, Engineering, Dc Microgrids +13