Design For Test Coverage

Design for Test Coverage is a systematic methodology within the field of Design for Testability that specifically enhances the completeness and effectiveness of fault detection by maximizing the extent to which a system’s components and behaviors are exercised during testing.

43

Publications

3.1K

Citations

98

Authors

52

Institutions

Publications per year

2017–2026

2

Authors

98

  1. IP
    Irith Pomeranz

    University of Iowa, United States

    2 publications · 42 citations

    2

    h-index

  2. SR
    S.M. Reddy

    University of Iowa, United States

    2 publications · 42 citations

    2

    h-index

  3. AO
    Alex Orailoğlu

    University of California San Diego, United States

    2 publications · 74 citations

    2

    h-index

  4. MM
    M.R. Mercer

    The University of Texas at Austin, United States

    2 publications · 36 citations

    2

    h-index

  5. HF
    Hideo Fujiwara

    Nara Institute of Science and Technology, Japan

    2 publications · 26 citations

    2

    h-index

1–5 of 98

Venues

  1. 3

    h-index

  2. Information and Software Technology

    2 publications · 58 citations

    2

    h-index

  3. IEEE Design & Test of Computers

    2 publications · 27 citations

    2

    h-index

  4. IEEE Transactions on Computers

    2 publications · 70 citations

    2

    h-index

  5. Frontiers of Computer Science

    1 publications · 11 citations

    1

    h-index

1–5