Design For Test Coverage
Design for Test Coverage is a systematic methodology within the field of Design for Testability that specifically enhances the completeness and effectiveness of fault detection by maximizing the extent to which a system’s components and behaviors are exercised during testing.
43
Publications
3.1K
Citations
98
Authors
52
Institutions
Publications per year
2017–2026
2
Parents
43
Testing of Quantum Cellular Automata
Mehdi B. Tahoori, Jing Huang, M. Momenzadeh et al. · IEEE Transactions on Nanotechnology · 2004 · 180 citations
Engineering, Computer Engineering, Electrical Engineering +13
A variable strength interaction testing of components
Myra B. Cohen, Peter B. Gibbons, W.B. Mugridge et al. · 2004 · 125 citations
March LR: a test for realistic linked faults
A.J. van de Goor, Georgi Gaydadjiev, V. G. Mikitjuk et al. · 2002 · 122 citations
Skewed-Load Transition Test: Part II, Coverage
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52
University of Iowa
Iowa City, United States
2 h-index
3 publications
73 citations
Stanford University
Stanford, United States
2 h-index
3 publications
187 citations
University of Illinois Urbana-Champaign
Urbana, United States
2 h-index
5 publications
110 citations
Purdue University West Lafayette
West Lafayette, United States
2 h-index
2 publications
21 citations
Motorola (United States)
Schaumburg, United States
2 h-index
4 publications
47 citations

Endicott College
Beverly Cove, United States
2 h-index
2 publications
39 citations
University of California San Diego
San Diego, United States
2 h-index
3 publications
89 citations
Analog Devices (United States)
Norwood, United States
2 h-index
4 publications
77 citations
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3 publications · 53 citations
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2 publications · 58 citations
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2 publications · 27 citations
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2 publications · 70 citations
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1 publications · 11 citations
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