Alex Orailoğlu

Test volume and application time reduction through scan chain concealment

I. Bayraktaroglu, Alex Orailoğlu · 2001 · 222 citations

Computing, Computer Engineering, Computer Systems +10

Architectures for silicon nanoelectronics and beyond

R. Iris Bahar, C. Geoffrey Lau, Dan Hammerstrom et al. · Computer · 2007 · 92 citations

Engineering, Computer Engineering, Systems Engineering +16

Sanity-Check: Boosting the Reliability of Safety-Critical Deep Neural Network Applications

Elbruz Ozen, Alex Orailoğlu · 2019 · 77 citations

Computing, Computer Engineering, Computer Science +17

Reducing Test Application Time Through Test Data Mutation Encoding

Sherief Reda, Alex Orailoğlu · 2002 · 75 citations

Computing, Computer Engineering, Computer Science +15

Test power reduction through minimization of scan chain transitions

Ozgur Sinanoglu, I. Bayraktaroglu, Alex Orailoğlu · 2003 · 68 citations

Engineering, Computer Engineering, Electrical Engineering +14