Concepedia

Boundary Scan

Boundary Scan is a standardized structural test methodology that enables the observation and control of interconnects between integrated circuit pins through a serial shift register inserted at the boundary of the device, thereby facilitating the detection of manufacturing defects in digital systems.

152

Publications

4.9K

Citations

319

Authors

119

Institutions

Publications per year

2017–2026

4

Parents

Publications

152

Built-In Self-Test Techniques

Edward R. McCluskey · IEEE Design & Test of Computers · 1985 · 422 citations

, , +16

DESIGN FOR TESTABILITY USING SCANPATH TECHNIQUES FOR PATH-DELAY TEST AND MEASUREMENT

Bulent I. Dervisoglu, Gayvin E. Stong · 2005 · 167 citations

, , +15

Testing and diagnosis of interconnects using boundary scan architecture

A.S.M. Hassan, Janusz Rajski, V.K. Agarwal · 2003 · 142 citations

, , +17

The PowerPC 604 RISC microprocessor.

S.P. Song, Matthew R Denman, J. Chang · IEEE Micro · 1994 · 118 citations

, , +9

Built-In Self-Test Structures

Edward R. McCluskey · IEEE Design & Test of Computers · 1985 · 103 citations

, , +16

1–5 of 152

Authors

319

  1. KP
    Kenneth P. Parker

    Agilent Technologies (United States), United States

    7 publications · 136 citations

    7

    h-index

  2. CY
    C.W. Yau

    AT&T (United States), United States

    6 publications · 224 citations

    6

    h-index

  3. WC
    Wu-Tung Cheng

    Mentor Technologies, United States

    5 publications · 179 citations

    5

    h-index

  4. KL
    Kuen-Jong Lee

    National Cheng Kung University, Taiwan

    4 publications · 115 citations

    4

    h-index

  5. RE
    Rodham E. Tulloss

    Theodore Roosevelt High School, United States

    4 publications · 85 citations

    4

    h-index

1–5 of 319

Institutions

119

  1. AT&T (United States)

    Bedminster, United States

    11 h-index

    21 publications

    733 citations

  2. Philips (Netherlands)

    Amsterdam, The Netherlands

    7 h-index

    22 publications

    526 citations

  3. IBM (United States)

    Armonk, United States

    6 h-index

    13 publications

    283 citations

  4. Agilent Technologies (United States)

    Santa Clara, United States

    6 h-index

    6 publications

    133 citations

  5. Mentor Technologies

    Tulsa, United States

    5 h-index

    9 publications

    287 citations

  6. Hewlett-Packard (United States)

    Palo Alto, United States

    4 h-index

    7 publications

    458 citations

  7. National Cheng Kung University

    Tainan City, Taiwan

    4 h-index

    10 publications

    325 citations

  8. The University of Texas at Dallas

    Richardson, United States

    4 h-index

    12 publications

    393 citations

1–8 of 119

Venues

  1. IEEE Design & Test of Computers

    11 publications · 733 citations

    11

    h-index

  2. 8

    h-index

  3. Journal of Electronic Testing

    JETTA · 4 publications · 57 citations

    4

    h-index

  4. Microelectronics Journal

    3 publications · 87 citations

    3

    h-index

  5. 3

    h-index

1–5