Concepedia

N. Jarwala

NJ

Statistics

Publications

7

Citations

368

H-Index

7

Active since

1988

Affiliations

AT&T (United States)(Current)

N. Jarwala is an author at AT&T (United States) specializing in design for testing, engineering, and built-in self-test.

Top concepts

EngineeringDesign For TestingSoftware TestingBuilt-in Self-testComputer EngineeringComputer ScienceSystems EngineeringComputer ArchitectureDiagnosisSystem Software

Publications per year

1988–2005

7

Publications

7

A new framework for analyzing test generation and diagnosis algorithms for wiring interconnects

N. Jarwala, C.W. Yau · 2003 · 167 citations

Electrical Engineering, Reliability Engineering, Novel Framework +14

A unified theory for designing optimal test generation and diagnosis algorithms for board interconnects

C.W. Yau, N. Jarwala · 2003 · 87 citations

Engineering, Diagnosis, Printed Circuit Board +18

Achieving Board-Level BIST Using the Boundary-Scan Master

N. Jarwala, C.W. Yau · 2005 · 34 citations

Engineering, Electronic Design Automation, Computer Architecture +20

The boundary-scan master: target applications and functional requirements

C.W. Yau, N. Jarwala · 2002 · 26 citations

External Applications, Engineering, Hardware Verification Language +25

TRAM: a design methodology for high-performance, easily testable, multimegabit RAMs

N. Jarwala, Dhiraj K. Pradhan · IEEE Transactions on Computers · 1988 · 23 citations

Engineering, Mem Testing, Computer Architecture +17

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