Diagnostic Test Generation

Diagnostic Test Generation is a method within the field of design for testability that systematically produces test patterns to identify and isolate faults in digital circuits by distinguishing faulty behaviors from nominal operation through targeted diagnostic analysis.

346

Publications

14.1K

Citations

1.2K

Authors

471

Institutions

Publications per year

2017–2026

Parents

Design For Testability

Publications

346

Cat Scratch Disease in Connecticut -- Epidemiology, Risk Factors, and Evaluation of a New Diagnostic Test

Kenneth M. Zangwill, Douglas H. Hamilton, Bradley A. Perkins et al. · New England Journal of Medicine · 1993 · 529 citations

Medicine, Dermatology, Infectious Diseases +10

The hemizona assay (HZA): development of a diagnostic test for the binding of human spermatozoa to the human hemizona pellucida to predict fertilization potential

Lani J. Burkman, Charles C. Coddington, Daniel R. Franken et al. · Fertility and Sterility · 1988 · 397 citations

Medicine, Genetics, Molecular Biology +15

Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits

J. P. Roth, W. G. Bouricius, Peter R. Schneider · IEEE Transactions on Electronic Computers · 1967 · 374 citations

Engineering, Computer Engineering, Computer Science +15

Test theory for a new generation of tests

Choice Reviews Online · 1993 · 282 citations

Education, Educational Assessment, Educational Measurement +12

Improved Detection and Characterization of Paroxysmal Nocturnal Hemoglobinuria Using Fluorescent Aerolysin

Robert A. Brodsky, Galina L. Mukhina, Shiyong Li et al. · American Journal of Clinical Pathology · 2000 · 270 citations · Full text

Medicine, Hematology, Molecular Biology +13

1–5 of 346

Authors

1.2K

IP
Irith Pomeranz
University of Iowa, United States
17 publications · 335 citations
13
h-index
SR
S.M. Reddy
University of Iowa, United States
9 publications · 203 citations
9
h-index
MS
M. Sonza Reorda
Politecnico di Torino, Italy
7 publications · 307 citations
7
h-index
RG
Ruifeng Guo
Mentor Technologies, United States
6 publications · 110 citations
6
h-index
WF
W.K. Fuchs
University of Illinois Urbana-Champaign, United States
6 publications · 149 citations
6
h-index

1–5 of 1.2K

Institutions

471

1–8 of 471

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
15 publications · 564 citations
13
h-index
IEEE Transactions on Computers
15 publications · 824 citations
13
h-index
PubMed
Repository · 8 publications · 294 citations
8
h-index
Journal of Electronic Testing
JETTA · 5 publications · 108 citations
5
h-index
IEEE Transactions on Electronic Computers
4 publications · 694 citations
4
h-index

1–5