M. Enamul Amyeen

Evaluation of the quality of N-detect scan ATPG patterns on a processor

M. Enamul Amyeen, Aparajita Ojha, Sang-Bong Lee · 2005 · 63 citations

Different Metrics, Engineering, Measurement +21

Improving Precision Using Mixed-level Fault Diagnosis

M. Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman · Proceedings/Proceedings - International Test Conference · 2006 · 45 citations

Fault Diagnosis, Engineering, Transistor Level +20

Testing for systematic defects based on DFM guidelines

Dongok Kim, M. Enamul Amyeen, Srikanth Venkataraman et al. · 2007 · 32 citations

Software Maintenance, Engineering, Electronic Design Automation +18

Fault equivalence identification using redundancy information and static and dynamic extraction

M. Enamul Amyeen, W.K. Fuchs, Irith Pomeranz et al. · 2002 · 29 citations

Fault Diagnosis, Fault Equivalence Identification, Engineering +23

Fault equivalence identification in combinational circuits using implication and evaluation techniques

M. Enamul Amyeen, W.K. Fuchs, Irith Pomeranz et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2003 · 20 citations

Fault Equivalence Identification, Engineering, Verification +22