Timing Faults

Timing Fault is a type of fault model in digital circuit testing that belongs to the category of permanent faults and is distinguished by its characterization of delays in signal propagation that violate the circuit’s specified timing constraints, leading to incorrect circuit behavior under normal operating conditions.

691

Publications

25.9K

Citations

1.1K

Authors

302

Institutions

Publications per year

2017–2026

Parents

Fault Modeling

Publications

691

Model for Delay Faults Based Upon Paths

Gordon L. Smith · International Test Conference · 1985 · 710 citations

Engineering, Computer Engineering, Computer Science +14

On Delay Fault Testing in Logic Circuits

Chin Jen Lin, S.M. Reddy · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1987 · 562 citations

Engineering, Computer Engineering, Electrical Engineering +16

Algorithms for scheduling imprecise computations

J.W.S. Liu, Kuo-Yi Lin, Wen-Chieh Shih et al. · Computer · 1991 · 528 citations

Computing, Computer Engineering, Computer Science +12

Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance

Keith Bowman, James Tschanz, Nam Sung Kim et al. · IEEE Journal of Solid-State Circuits · 2009 · 342 citations

Engineering, Computer Engineering, Electrical Engineering +17

Clock recovery from random binary signals

John Alexander · Electronics Letters · 1975 · 309 citations

Engineering, Computer Engineering, Electrical Engineering +16

1–5 of 691

Authors

1.1K

SR
S.M. Reddy
University of Iowa, United States
48 publications · 2.4K citations
28
h-index
KC
Kwang‐Ting Cheng
University of California, Santa Barbara, United States
45 publications · 1.8K citations
27
h-index
IP
Irith Pomeranz
University of Iowa, United States
42 publications · 1.2K citations
20
h-index
VD
Vishwani D. Agrawal
AT&T (United States), United States
33 publications · 1K citations
18
h-index
AK
A. Krstić
University of California, Santa Barbara, United States
17 publications · 569 citations
16
h-index

1–5 of 1.1K

Institutions

302

1–8 of 302

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
75 publications · 3.8K citations
33
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
29 publications · 647 citations
16
h-index
IEEE Transactions on Computers
20 publications · 1K citations
14
h-index
IEEE Design & Test of Computers
13 publications · 857 citations
12
h-index
Journal of Electronic Testing
JETTA · 13 publications · 228 citations
11
h-index

1–5