Keith Bowman

Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration

Keith Bowman, Steven G. Duvall, J.D. Meindl · IEEE Journal of Solid-State Circuits · 2002 · 744 citations

Engineering, Vlsi Design, Fmax Mean +17

Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance

Keith Bowman, James Tschanz, Nam Sung Kim et al. · IEEE Journal of Solid-State Circuits · 2009 · 337 citations

Equal Throughput, Engineering, Vlsi Design +26

A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance

Keith Bowman, James Tschanz, Shih‐Lien L. Lu et al. · IEEE Journal of Solid-State Circuits · 2010 · 259 citations

Engineering, Vlsi Design, Microprocessor Core +20

A physical alpha-power law MOSFET model

Keith Bowman, B.L. Austin, J.C. Eble et al. · IEEE Journal of Solid-State Circuits · 1999 · 153 citations

Device Modeling, Low-power Electronics, Electrical Engineering +13

Tunable replica circuits and adaptive voltage-frequency techniques for dynamic voltage, temperature, and aging variation tolerance

James Tschanz, Keith Bowman, Steve Walstra et al. · 2009 · 137 citations

Low-power Electronics, Replica Circuits, Electrical Engineering +14