Kee Sup Kim

X-compact: an efficient response compaction technique for test cost reduction

Subhasish Mitra, Kee Sup Kim · 2003 · 214 citations

Engineering, Mem Testing, Test Response Data +18

Sequential Element Design With Built-In Soft Error Resilience

Ming Zhang, Subhasish Mitra, Terrence Mak et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2006 · 208 citations

Engineering, Vlsi Design, Mem Testing +19

Combinational Logic Soft Error Correction

Subhasish Mitra, Ming Zhang, Saad Waqas et al. · 2006 · 164 citations

Logic Synthesis, Fuzzy Logic, Engineering +11

13.2 A 14nm FinFET 128Mb 6T SRAM with V<inf>MIN</inf>-enhancement techniques for low-power applications

Taejoong Song, Woojin Rim, Jong Hoon Jung et al. · 2014 · 106 citations

Low-power Electronics, Finfet Device, Electrical Engineering +15

Delay defect characteristics and testing strategies

Kee Sup Kim, Subhasish Mitra, P.G. Ryan · IEEE Design & Test of Computers · 2003 · 87 citations

Reliability, Dft Techniques, Reliability Engineering +14