Transition Fault Testing

Transition Fault Testing is a structural test method used in built-in self-test systems that distinguishes itself by detecting timing-related defects caused by slow signal transitions between logic states in digital circuits.

100

Publications

4.7K

Citations

234

Authors

Institutions

Publications per year

2017–2026

Variants

Transition Delay Testing

Parents

Built-in Self-test

Publications

100

Transition Fault Simulation

J.A. Waicukauski, Eric Lindbloom, Barry K. Rosen et al. · IEEE Design & Test of Computers · 1987 · 402 citations

Engineering, Computer Engineering, Electrical Engineering +16

Broad-side delay test

J. Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1994 · 255 citations

Engineering, Computer Engineering, Computer Science +14

Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm

T. Bartenstein, D. Heaberlin, L.M. Huisman et al. · 2002 · 208 citations

Engineering, Computer Engineering, Computer Science +16

Scan-based transition test

J. Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1993 · 203 citations

Engineering, Computer Engineering, Computer Science +13

Scan-based transition fault testing - implementation and low cost test challenges

J. Saxena, Kenneth M. Butler, J. Gatt et al. · 2003 · 130 citations

Engineering, Computer Engineering, Electrical Engineering +14

1–5 of 100

Authors

234

IP
Irith Pomeranz
University of Iowa, United States
16 publications · 525 citations
12
h-index
SR
S.M. Reddy
University of Iowa, United States
14 publications · 514 citations
12
h-index
EM
E.J. McCluskey
Stanford University, United States
8 publications · 467 citations
8
h-index
KC
Kwang‐Ting Cheng
University of California, Santa Barbara, United States
8 publications · 298 citations
8
h-index
YS
Yasuo Satô
Kyushu Institute of Technology, Japan
5 publications · 100 citations
5
h-index

1–5 of 234

Institutions

1–8 of 65

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
11 publications · 827 citations
10
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
4 publications · 104 citations
4
h-index
Proceedings/Proceedings - International Test Conference
ITC · 3 publications · 58 citations
3
h-index
Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium
VTS · 3 publications · 95 citations
3
h-index
IEEE Design & Test of Computers
2 publications · 454 citations
2
h-index

1–5