Microelectronic Engineering · 2016 · 13 citations · 19 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsMicrofabricationElectron Beam LithographyElectron Beam PhysicsSoft LithographyElectron Beam Resist MaterialsResist PatterningResist ResolutionResist Sensitivity
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Optimal temperature for development of poly(methylmethacrylate)
B. Cord, Jodie L. Lutkenhaus, Karl K. Berggren · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2007 · 93 citations
Natural Sciences, Materials Engineering, Materials Science +17
Influence of molecular weight of resist polymers on surface roughness and line-edge roughness
Toru Yamaguchi, Kenji Yamazaki, H. Namatsu · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2004 · 57 citations
Natural Sciences, Materials Engineering, Materials Science +17