Concepedia

Publication | Closed Access

Virtual qualification of moisture induced failures of advanced packages

DOI

37

Citations

13

References

2007

Year

M.A.J. van Gils, W.D. van Driel, G.Q. Zhang, H.J.L. Bressers, R.B.R. van Silfhout, Xuejun Fan, J.H.J. Janssen
Microelectronics Reliability

References

YearCitations

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