2006 · 12 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsBipolar Junction TransistorsDevice ReliabilityIii-v SemiconductorsNoise In Electronic DevicesNoise In Semiconductor DevicesSemiconductor ReliabilityAvalanche BreakdownBreakdown MechanismsBreakdown VoltageHeterojunction Bipolar TransistorsNoise In Bipolar Junction TransistorsOperating ConditionsOperating VoltageVoltage
SiGe-heterojunction bipolar transistors (HBTs) still sustain their leading RF-application position due to their good noise and HF properties. They also offer a relatively high operating voltage, which is limited by BV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">CEO</sub> , the emitter collector breakdown voltage with open base. We show that BV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">CER</sub> , the avalanche breakdown with a resistor RB connected to the base, can be used to define reliable operating conditions exceeding BV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">CEO</sub> . The measured BV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">CER </sub> data correlate very well with values calculated from basic transistor parameters and their corresponding multiplication factor data. The functionality of this concept is verified by investigating a power amplifier circuit used at emitter collector voltages exceeding BV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">CEO</sub> in operational mode enabling significant higher output power
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Ionization Rates for Holes and Electrons in Silicon
S. L. Miller · Physical Review · 1957 · 269 citations