A. Neugroschel

Direct-current measurements of oxide and interface traps on oxidized silicon

A. Neugroschel, Chih‐Tang Sah, Ki-Lim Han et al. · IEEE Transactions on Electron Devices · 1995 · 183 citations

Engineering, Electrical Engineering, Materials Science +17

Experimental study of the minority-carrier transport at the polysilicon—monosilicon interface

A. Neugroschel, M. Arienzo, Y. Komem et al. · IEEE Transactions on Electron Devices · 1985 · 87 citations

Engineering, Electrical Engineering, Materials Science +17

Systematic analytical solutions for minority-carrier transport in semiconductors with position-dependent composition, with application to heavily doped silicon

Jong‐Sik Park, A. Neugroschel, F.A. Lindholm · IEEE Transactions on Electron Devices · 1986 · 79 citations

Engineering, Electrical Engineering, Materials Science +17

A methodology for experimentally based determination of gap shrinkage and effective lifetimes in the emitter and base of p-n junction solar cells and other p-n junction devices

F.A. Lindholm, A. Neugroschel, Chih‐Tang Sah et al. · IEEE Transactions on Electron Devices · 1977 · 67 citations

Engineering, Electrical Engineering, Materials Science +17

Degradation of bipolar transistor current gain by hot holes during reverse emitter-base bias stress

A. Neugroschel, Chih‐Tang Sah, Michael S. Carroll · IEEE Transactions on Electron Devices · 1996 · 62 citations

Engineering, Electrical Engineering, Materials Science +17