Concepedia

Y. Komem

YK

Statistics

Publications

38

Citations

2.3K

H-Index

26

Active since

1970

Affiliations

Technion – Israel Institute of Technology(Current)

IBM Research - Thomas J. Watson Research Center

Tel Aviv University

Carnegie Mellon University

Rutgers, The State University of New Jersey

Y. Komem is an author at Technion – Israel Institute of Technology specializing in engineering, applied physics, and materials science.

Top concepts

EngineeringMaterial ScienceApplied PhysicsThin FilmsSurface ScienceNanotechnologyMaterials EngineeringGas DetectionSemiconductorsMechanics Of Materials

Publications per year

1970–2018

38

Publications

38

The effect of grain size on the sensitivity of nanocrystalline metal-oxide gas sensors

Avner Rothschild, Y. Komem · Journal of Applied Physics · 2004 · 607 citations

Engineering, Gas Sensor, Grain Size +18

Electron microscope studies of grain boundary dislocation behavior

R. W. Balluffi, Y. Komem, T. Schober · Surface Science · 1972 · 209 citations

Engineering, Electron Microscope Studies, Dislocation Interaction +5

Sensing behavior of TiO2 thin films exposed to air at low temperatures

Avner Rothschild, F. Edelman, Y. Komem et al. · Sensors and Actuators B Chemical · 2000 · 147 citations

Materials Science, Low Temperatures, Engineering +9

Interfacial reactions between Ni films and GaAs

A. Lahav, M. Eizenberg, Y. Komem · Journal of Applied Physics · 1986 · 127 citations

Semiconductors, Materials Science, Electrical Engineering +15

Experimental study of the minority-carrier transport at the polysilicon&#8212;monosilicon interface

A. Neugroschel, M. Arienzo, Y. Komem et al. · IEEE Transactions on Electron Devices · 1985 · 87 citations

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