Concepedia

Y. Komem

YK

Statistics

Publications

38

Citations

2.3K

H-Index

26

Active since

1970

Affiliations

Technion – Israel Institute of Technology(Current)

IBM Research - Thomas J. Watson Research Center

Tel Aviv University

Carnegie Mellon University

Rutgers, The State University of New Jersey

Y. Komem is an author at Technion – Israel Institute of Technology specializing in materials science, natural sciences, and materials engineering.

Publications per year

1970–2018

38

Publications

38

The effect of grain size on the sensitivity of nanocrystalline metal-oxide gas sensors

Avner Rothschild, Y. Komem · Journal of Applied Physics · 2004 · 619 citations

Natural Sciences, Materials Engineering, Materials Science +17

Electron microscope studies of grain boundary dislocation behavior

R. W. Balluffi, Y. Komem, T. Schober · Surface Science · 1972 · 211 citations

Natural Sciences, Materials Science, Physics +14

Sensing behavior of TiO2 thin films exposed to air at low temperatures

Avner Rothschild, F. Edelman, Y. Komem et al. · Sensors and Actuators B Chemical · 2000 · 148 citations

Natural Sciences, Materials Engineering, Materials Science +14

Interfacial reactions between Ni films and GaAs

A. Lahav, M. Eizenberg, Y. Komem · Journal of Applied Physics · 1986 · 127 citations

Engineering, Materials Engineering, Materials Science +17

Experimental study of the minority-carrier transport at the polysilicon&#8212;monosilicon interface

A. Neugroschel, M. Arienzo, Y. Komem et al. · IEEE Transactions on Electron Devices · 1985 · 87 citations

Engineering, Electrical Engineering, Materials Science +17

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