Concepedia

F. Edelman

FE

13

Publications

455

Citations

12

H-Index

1988

Active since

Affiliations

Technion – Israel Institute of Technology(Current)

Max Planck Institute of Microstructure Physics

Forschungszentrum Jülich

Max Planck Society

F. Edelman is an author at Technion – Israel Institute of Technology specializing in applied physics, materials science, and engineering.

Top concepts

EngineeringApplied PhysicsMaterial ScienceThin FilmsSurface ScienceCrystalline DefectsMaterials EngineeringSemiconductorsPhysicsChemistry

Publications per year

1988–2008

13

Publications

13

Sensing behavior of TiO2 thin films exposed to air at low temperatures

Avner Rothschild, F. Edelman, Y. Komem et al. · Sensors and Actuators B Chemical · 2000 · 147 citations

Materials Science, Low Temperatures, Engineering +9

Initial crystallization stage of amorphous germanium films

F. Edelman, Y. Komem, Michael Bendayan et al. · Journal of Applied Physics · 1992 · 58 citations

Materials Science, Materials Engineering, Epitaxial Growth +14

Structure of CdZnTe films on glass

Sara Stolyarova, F. Edelman, A. Chack et al. · Journal of Physics D Applied Physics · 2008 · 45 citations

Engineering, Optical Glass, Optical Absorption +20

Structural evolution of SnO2TiO2 nanocrystalline films for gas sensors

F. Edelman, Horst Hahn, S. Seifried et al. · Materials Science and Engineering B · 2000 · 45 citations

Crystallization of amorphous hydrogenated Si1−xGex films

F. Edelman, R. Weil, P. Werner et al. · physica status solidi (a) · 1995 · 29 citations

Materials Engineering, Semiconductors, Materials Science +15

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