Chih‐Tang Sah

Carrier Generation and Recombination in P-N Junctions and P-N Junction Characteristics

Chih‐Tang Sah, Robert N. Noyce, W. Shockley · Proceedings of the IRE · 1957 · 2.1K citations

Device Modeling, Electrical Engineering, Carrier Generation +15

Deactivation of the boron acceptor in silicon by hydrogen

Chih‐Tang Sah, Jack Yuan-Chen Sun, Joseph Jeng-Tao Tzou · Applied Physics Letters · 1983 · 319 citations

Semiconductors, Sio2 Film, Chemical Engineering +15

Electron-Hole Recombination Statistics in Semiconductors through Flaws with Many Charge Conditions

Chih‐Tang Sah, W. Shockley · Physical Review · 1958 · 237 citations

Semiconductors, Electron Density, Semiconductor Technology +13

Direct-current measurements of oxide and interface traps on oxidized silicon

A. Neugroschel, Chih‐Tang Sah, Ki-Lim Han et al. · IEEE Transactions on Electron Devices · 1995 · 183 citations

Electrical Engineering, Semiconductor Device, Engineering +11

Evolution of the MOS transistor-from conception to VLSI

Chih‐Tang Sah · Proceedings of the IEEE · 1988 · 153 citations

Silicon Mosfet, Non-volatile Memory, Engineering +20