IEEE Journal of Solid-State Circuits · 2004 · 68 citations · 14 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesComplementary Metal-oxide-semiconductor TechnologyDevice ScalingHigh-frequency Semiconductor DevicesIntegrated Circuit DesignMillimeter-wave CommunicationsRadio-frequency Integrated CircuitsBicmos TechnologyHigh-efficiency Power AmplifiersPower Amplifier DesignPower Electronics DevicesPower OutputSige Bicmos DesignSilicon Germanium Bipolar TransistorTransistor Scaling
This paper discusses and illustrates the key device design issues for SiGe BiCMOS HBTs suitable for wireless power amplifier (PA) applications. Experimental results addressing ruggedness, ac performance, and safe operating area for high-breakdown SiGe HBTs built in several generations of BiCMOS technology are presented. Implications of recent high-performance SiGe HBT scaling achievements for BiCMOS technologies targeting wireless PA applications are considered. Circuit results for GSM, PCS, GPRS, and EDGE front-end modules have been obtained. A one-chip solution is demonstrated, including control circuitry and switching functionality, that supports all GPRS, PCS, and EDGE modes featuring output power at 33.8 dBm and overall power added efficiency of 37% withstanding voltage standing wave ratio conditions of 15:1.
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Structural dependence of the thermal resistance of trench-isolated bipolar transistors
Jae-Sung Rieh, J. Johnson, S. Furkay et al. · 2003 · 56 citations
Advanced passive devices for enhanced integrated RF circuit performance
D. Coolbaugh, E. Eshun, R. Groves et al. · 2003 · 39 citations