2008 · 16 citations · 12 references
EngineeringComputer EngineeringElectrical EngineeringFault ToleranceFault-tolerant ComputingMicroelectronicsDesign For TestabilityDevice CharacterizationDevice ReliabilityHardware Fault ToleranceIntegrated Circuit DesignSemiconductor ReliabilityDevice VariabilityHardware Reliability AnalysisReliability QualificationReliability SimulationSoft Error DetectionSoft Error MitigationSoft Error Reliability
We present a practical, systematical method for the evaluation of the soft error rate (SER) of microelectronic devices. Existing methodologies, practices and tools are integrated in a common approach while highlighting the need for specific data or tools. The showcased method is particularly adapted for evaluating the SER of very complex microelectronic devices by engineers confronted to increasingly demanding reliability requirements.
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SRAM SER in 90, 130 and 180 nm bulk and SOI technologies
Ethan H. Cannon, D.D. Reinhardt, Michael S. Gordon et al. · 2004 · 103 citations
Engineering, Computer Engineering, Electrical Engineering +16