Reliability Qualification

Reliability Qualification is a formal methodology within the domain of device reliability and reliability validation that systematically verifies whether a device or component meets predefined reliability criteria under specified operating conditions and lifetime expectations.

Publications

3.2K

Citations

219

Authors

Institutions

Publications per year

2017–2026

Parents

Device ReliabilityReliability Validation

Publications

Review of Commercial GaN Power Devices and GaN-Based Converter Design Challenges

Edward A. Jones, Fred Wang, Daniel Costinett · IEEE Journal of Emerging and Selected Topics in Power Electronics · 2016 · 1.2K citations

Engineering, Electrical Engineering, Materials Science +17

The Case for Lifetime Reliability-Aware Microprocessors

Jayanth Srinivasan, Sarita V. Adve, Pradip Bose et al. · ACM SIGARCH Computer Architecture News · 2004 · 378 citations

Engineering, Computer Engineering, Computer Science +15

The case for lifetime reliability-aware microprocessors

J. Srinivasan, Sarita V. Adve, Pradip Bose et al. · 2004 · 205 citations

Engineering, Computer Engineering, Computer Science +15

Lifetime Reliability: Toward an Architectural Solution

J. Srinivasan, Sarita V. Adve, Pradip Bose et al. · IEEE Micro · 2005 · 202 citations

Engineering, Computer Engineering, Computer Science +17

Application of reliability test standards to SiC Power MOSFETs

Ronald Green, Aivars J. Lelis, Daniel B. Habersat · 2011 · 74 citations · Full text

Engineering, Electrical Engineering, Microelectronics +12

1–5 of 59

Authors

219

PB
Pradip Bose
IBM Research - Thomas J. Watson Research Center, United States
3 publications · 785 citations
3
h-index
SV
Sarita V. Adve
University of Illinois Urbana-Champaign, United States
3 publications · 785 citations
3
h-index
JA
Jude A. Rivers
IBM Research - Thomas J. Watson Research Center, United States
3 publications · 785 citations
3
h-index
AL
Austin Lesea
Xilinx (United States), United States
2 publications · 29 citations
2
h-index
RK
Robert Kwasnick
General Electric (United States), United States
2 publications · 40 citations
2
h-index

1–5 of 219

Institutions

1–8 of 81

Venues

Microelectronics Reliability
3 publications · 66 citations
3
h-index
IEEE Transactions on Device and Materials Reliability
2 publications · 32 citations
2
h-index
IEEE Transactions on Components and Packaging Technologies
2 publications · 59 citations
2
h-index
IEEE Micro
1 publications · 202 citations
1
h-index
Materials
1 publications · 12 citations
1
h-index

1–5