Concepedia

Hardware Reliability Analysis

Hardware Reliability Analysis is a systematic engineering method that evaluates the probability of hardware components or systems performing intended functions under specified conditions for a given time period, distinguished from other reliability analyses by its exclusive focus on physical hardware degradation, failure mechanisms, and structural robustness.

344

Publications

14.9K

Citations

1.1K

Authors

318

Institutions

Publications per year

2017–2026

45

Parents

Publications

344

Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation

Shekhar Borkar · IEEE Micro · 2005 · 1.3K citations

, , +17

Characterizing cloud computing hardware reliability

Kashi Venkatesh Vishwanath, Nachiappan Nagappan · 2010 · 507 citations

, , +16

Defect Level as a Function of Fault Coverage

Williams, Brown · IEEE Transactions on Computers · 1981 · 348 citations

, , +17

Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events

Rouwaida Kanj, Rajiv Joshi, Sani Nassif · 2006 · 344 citations

, , +8

Microelectronics reliability

J. Wayne Meredith · 2003 · 297 citations

, , +13

1–5 of 344

Authors

1.1K

  1. DG
    Dimitris Gizopoulos

    National and Kapodistrian University of Athens, Greece

    10 publications · 298 citations

    10

    h-index

  2. LS
    Luca Sterpone

    Politecnico di Torino, Italy

    10 publications · 288 citations

    10

    h-index

  3. MV
    M. Violante

    Politecnico di Torino, Italy

    8 publications · 256 citations

    8

    h-index

  4. MS
    M. Sonza Reorda

    Politecnico di Torino, Italy

    6 publications · 114 citations

    6

    h-index

  5. SD
    Stefano Di Carlo

    Politecnico di Torino, Italy

    6 publications · 136 citations

    6

    h-index

1–5 of 1.1K

Institutions

318

  1. Intel (United States)

    Santa Clara, United States

    16 h-index

    85 publications

    4.2K citations

  2. Politecnico di Torino

    Turin, Italy

    14 h-index

    55 publications

    1.3K citations

  3. IBM (United States)

    Armonk, United States

    14 h-index

    38 publications

    1.7K citations

  4. National and Kapodistrian University of Athens

    Athens, Greece

    10 h-index

    32 publications

    993 citations

  5. Northeastern University

    Boston, United States

    7 h-index

    12 publications

    664 citations

  6. University of Michigan

    Ann Arbor, United States

    7 h-index

    22 publications

    1.6K citations

  7. Universidade Federal do Rio Grande do Sul

    Porto Alegre, Brazil

    7 h-index

    22 publications

    760 citations

  8. University of Illinois Urbana-Champaign

    Urbana, United States

    7 h-index

    21 publications

    932 citations

1–8 of 318

Venues

  1. Microelectronics Reliability

    20 publications · 464 citations

    15

    h-index

  2. IEEE Transactions on Nuclear Science

    14 publications · 595 citations

    13

    h-index

  3. IEEE Transactions on Reliability

    10 publications · 614 citations

    10

    h-index

  4. IEEE Micro

    6 publications · 1.6K citations

    6

    h-index

  5. IEEE Transactions on Computers

    6 publications · 537 citations

    6

    h-index

1–5