Publication | Closed Access
Microelectronics reliability
296
Citations
5
References
2003
Year
Unknown Venue
ReliabilityReliability GoalsElectrical EngineeringReliability EngineeringReliability-based DesignReliability Management Systems DesignEngineeringReliability ModellingReliability TestingHardware ReliabilityDevice ReliabilitySystems EngineeringFailure RatesReliability ModelingManufacturing TeamMicroelectronicsAccelerated Life TestingDesign For Reliability
The author points out the importance of the involvement of the design and manufacturing team in achieving reliability of microelectronic devices. A method of verifying reliability goals through calculation of failure rates based on life test parameters is described. An example illustrating the method is shown.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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