Soft Error Reliability is a reliability metric that quantifies a device's resilience to transient faults caused by ionizing radiation or electrical noise, distinguishing it from permanent failure mechanisms by focusing on non-destructive, reversible deviations in circuit behavior.
277
Publications
15.6K
Citations
890
Authors
252
Institutions
Publications per year
2017–2026
59
Parents
Publications
277
Soft Errors in Advanced Computer Systems
R. Baumann · IEEE Design & Test of Computers · 2005 · 832 citations
Robust system design with built-in soft-error resilience
Subhasish Mitra, N. Seifert, M. Zhang et al. · Computer · 2005 · 562 citations
1–5 of 277
Authors
890
- MB
12
h-index
- BL
10
h-index
- JZ
9
h-index
- NS
9
h-index
- LW
8
h-index
1–5 of 890
Institutions
252
Intel (United States)
Santa Clara, United States
17 h-index
81 publications
11.2K citations
IBM (United States)
Armonk, United States
15 h-index
85 publications
12.8K citations
Vanderbilt University
Nashville, United States
15 h-index
71 publications
2.1K citations
Centre National de la Recherche Scientifique
Paris, France
12 h-index
32 publications
1.1K citations
IBM Research - Thomas J. Watson Research Center
Yorktown Heights, United States
12 h-index
28 publications
1.9K citations
University of Michigan
Ann Arbor, United States
11 h-index
28 publications
2.8K citations
Universidade Federal do Rio Grande do Sul
Porto Alegre, Brazil
9 h-index
23 publications
707 citations
Northeastern University
Boston, United States
9 h-index
19 publications
749 citations
1–8 of 252
Venues
- IEEE Transactions on Nuclear Science
33 publications · 2K citations
22
h-index
- IEEE Transactions on Device and Materials Reliability
12 publications · 695 citations
11
h-index
- IEEE Journal of Solid-State Circuits
8 publications · 546 citations
8
h-index
- Microelectronics Reliability
6 publications · 152 citations
6
h-index
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
7 publications · 433 citations
6
h-index
1–5