Eishi Ibe

Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule

Eishi Ibe, Hitoshi Taniguchi, Y. Yahagi et al. · IEEE Transactions on Electron Devices · 2010 · 487 citations

Engineering, Computer Architecture, Defect Tolerance +16

Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling

Eishi Ibe, Sung Chung, Shi-Jie Wen et al. · 2006 · 95 citations

Engineering, Nuclear Physics, Vlsi Design +21

16.7-fA/cell tunnel-leakage-suppressed 16-Mb SRAM for handling cosmic-ray-induced multierrors

Kensuke Osada, Y. Saitoh, Eishi Ibe et al. · IEEE Journal of Solid-State Circuits · 2003 · 93 citations

Hardware Security, Electrical Engineering, Engineering +15

Formation and dissolution of oxide film on zirconium alloys in 288°C pure water under γ-ray irradiation

Yoshitaka Nishino, Masao Endo, Eishi Ibe et al. · Journal of Nuclear Materials · 1997 · 39 citations

Materials Engineering, Materials Science, Chemical Engineering +4

Theoretical Model Analyses for Effects of Hydrogen Injection on Radiolysis of Coolant Water in BWR

Eishi Ibe, Masaharu Sakagami, Shunsuke Uchida · Journal of Nuclear Science and Technology · 1986 · 38 citations · Full text

Hydrogen Injection Test, Engineering, Radiation Systems +19