Sung Chung

Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling

Eishi Ibe, Sung Chung, Shi-Jie Wen et al. · 2006 · 95 citations

Engineering, Nuclear Physics, Vlsi Design +21

Re-using DFT logic for functional and silicon debugging test

Xinli Gu, Weili Wang, Kangrong Li et al. · 2003 · 28 citations

Hardware Security, Dft Logic, Engineering +13

Investigation of Thermal Neutron Induced Soft Error Rates in Commercial Srams with 0.35 μm to 90 nm Technologies

M. Olmos, R. Gaillard, Andreas Van Overberghe et al. · 2006 · 20 citations

Engineering, Nuclear Physics, Nuclear Data +21

At-speed interconnect test and diagnosis of external memories on a system

H.C. Kim, Hong-Shin Jun, Xinli Gu et al. · 2005 · 14 citations

Hardware Security, Electrical Engineering, Memory Architecture +15

An effort-minimized logic BIST implementation method

Xinli Gu, Sung Chung, F. Tsang et al. · 2002 · 14 citations

Engineering, Electronic Design Automation, Computer Architecture +20