Shi-Jie Wen

Comparison of Combinational and Sequential Error Rates for a Deep Submicron Process

N. N. Mahatme, S. Jagannathan, T. D. Loveless et al. · IEEE Transactions on Nuclear Science · 2011 · 146 citations

Engineering, Vlsi Design, Computer Architecture +20

SRAM Interleaving Distance Selection With a Soft Error Failure Model

Sanghyeon Baeg, Shi-Jie Wen, Richard Wong · IEEE Transactions on Nuclear Science · 2009 · 139 citations

Engineering, Vlsi Design, Mem Testing +17

Muon-Induced Single Event Upsets in Deep-Submicron Technology

Brian D. Sierawski, Marcus H. Mendenhall, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2010 · 110 citations

Single Event Upsets, Electrical Engineering, Experimental Data +10

Characterization of vanadium oxide thin films with different stoichiometry using Raman spectroscopy

Chunzi Zhang, Q. Yang, Cyril Koughia et al. · Thin Solid Films · 2016 · 97 citations

Materials Science, Material Analysis, Engineering +6

Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling

Eishi Ibe, Sung Chung, Shi-Jie Wen et al. · 2006 · 95 citations

Engineering, Nuclear Physics, Vlsi Design +21