Y. Yahagi

Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule

Eishi Ibe, Hitoshi Taniguchi, Y. Yahagi et al. · IEEE Transactions on Electron Devices · 2010 · 495 citations

Engineering, Computer Engineering, Electrical Engineering +15

Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling

Ibe Eishi, S. U. Chung, Wen S. et al. · IEICE technical report. Speech · 2006 · 43 citations

Engineering, Nuclear Engineering, Physics +9

A Novel Feature of Neutron-Induced Multi-Cell Upsets in 130 and 180 nm SRAMs

Y. Yahagi, H. Yamaguchi, Hideaki Kameyama et al. · IEEE Transactions on Nuclear Science · 2007 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +13

Installation and application of an intense 7Li(p,n) Neutron source for 20-90 MeV region

Mamoru Baba, H. Okamura, Masayuki Hagiwara et al. · Radiation Protection Dosimetry · 2007 · 19 citations

Engineering, Nuclear Engineering, Nuclear Instrumentation +12

Threshold energy of neutron-induced single event upset as a critical factor

Y. Yahagi, Yasuyuki Takahashi, Yoshiaki Saito et al. · 2004 · 17 citations

Engineering, Electrical Engineering, Physics +9