Trapping mechanisms in negative bias temperature stressed p-MOSFETs

Negative bias stress of MOS devices at high electric fields and degradation of MNOS devices

Kjell Jeppson, Christer Svensson · Journal of Applied Physics · 1977 · 678 citations · Full text

Engineering, Electrical Engineering, Materials Science +14

A model for the time- and bias-dependence of p-MOSFET degradation

M. Brox, A. v. Schwerin, Q. Wang et al. · IEEE Transactions on Electron Devices · 1994 · 46 citations

Engineering, Electrical Engineering, Electronic Materials +16

Hot-carrier degradation of p-MOSFET's under analog operation

R. Thewes, M. Brox, K. Goser et al. · IEEE Transactions on Electron Devices · 1997 · 25 citations

Engineering, Electrical Engineering, Analog Electronics +15

Effects of hot-carrier degradation in analog CMOS circuits

R. Thewes, Werner Weber · Microelectronic Engineering · 1997 · 23 citations

Engineering, Electrical Engineering, Analog Electronics +13

Impact of Negative-Bias Temperature Instability on the Lifetime of Single-Gate CMOS Structures with Ultrathin (4–6 nm) Gate Oxides

Shigeo Ogawa, Masakazu Shimaya, Noboru Shiono · Japanese Journal of Applied Physics · 1996 · 14 citations

Engineering, Electrical Engineering, Materials Science +17