Concepedia

Masakazu Shimaya

MS

Statistics

Publications

10

Citations

388

H-Index

10

Active since

1983

Affiliations

NTT (Japan)(Current)

Masakazu Shimaya is an author at NTT (Japan) specializing in materials science, engineering, and semiconductor devices.

Publications per year

1983–2002

10

Publications

10

Interface-trap generation at ultrathin SiO2 (4–6 nm)-Si interfaces during negative-bias temperature aging

Shigeo Ogawa, Masakazu Shimaya, Noboru Shiono · Journal of Applied Physics · 1995 · 198 citations

Engineering, Materials Engineering, Materials Science +17

Neutral electron trap generation in SiO2 by hot holes

Shigeo Ogawa, Noboru Shiono, Masakazu Shimaya · Applied Physics Letters · 1990 · 51 citations

Natural Sciences, Materials Science, Electronic Materials +11

Charge character of interface traps at the Si-SiO2 interface

Noboru Shiono, Masakazu Shimaya, O. Nakajima · Applied Physics Letters · 1986 · 28 citations

Engineering, Electrical Engineering, Materials Science +17

Electron Beam Induced Damage in Poly‐Si Gate MOS Structures and Its Effect on Long‐Term Stability

Masakazu Shimaya, Noboru Shiono, O. Nakajima et al. · Journal of The Electrochemical Society · 1983 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

Ionizing Radiation Effects in MOS Capacitors with Very Thin Gate Oxides

Noboru Shiono, Masakazu Shimaya, Koichi Sano · Japanese Journal of Applied Physics · 1983 · 18 citations

Engineering, Electrical Engineering, Materials Science +17

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