Jürgen Holz

The tunneling field effect transistor (TFET) as an add-on for ultra-low-voltage analog and digital processes

T. Nirschl, Pengzhan Wang, C. E. Webe et al. · 2005 · 70 citations

Electrical Engineering, Engineering, Vlsi Design +11

MOS transistor reliability under analog operation

R. Thewes, Ralf Brederlow, Christian Schlünder et al. · Microelectronics Reliability · 2000 · 31 citations

Reliability, Electrical Engineering, Mos Transistor Reliability +6

New method to determine the base resistance of bipolar transistors

J. Weng, Jürgen Holz, T.F. Meister · IEEE Electron Device Letters · 1992 · 29 citations

Internal Base Resistances, Electrical Engineering, Engineering +7

Trapping mechanisms in negative bias temperature stressed p-MOSFETs

Christian Schlünder, Ralf Brederlow, P. Wieczorek et al. · Microelectronics Reliability · 1999 · 28 citations

Negative Bias Temperature, Engineering, Physics +6

The impact of controlled sodium incorporation on rapid thermal processed Cu(InGa)Se/sub 2/-thin films and devices

V. Probst, J. Rimmasch, W. Riedl et al. · 2002 · 19 citations

Engineering, Thin Film Process Technology, Chemical Deposition +16