Charge Traps is a physical defect construct in semiconductor materials characterized by localized energy states within the bandgap that capture and immobilize charge carriers, thereby disrupting electrical conductivity and device performance.
2.6K
Publications
136.4K
Citations
9.4K
Authors
1.5K
Institutions
Publications per year
2017–2026
458
Variants
Charge Trapping Centers
Publications
2.6K
Statistics of the Recombinations of Holes and Electrons
W. Shockley, W. T. Read · Physical Review · 1952 · 6.4K citations
Space-Charge-Limited Currents in Solids
Albert Rose · Physical Review · 1955 · 1.7K citations
Electromagnetic traps for charged and neutral particles
Wolfgang Paul · Reviews of Modern Physics · 1990 · 1.5K citations
1–5 of 2.6K
Authors
9.4K
- GG
24
h-index
- RD
21
h-index
- JF
21
h-index
- GM
19
h-index
- EZ
19
h-index
1–5 of 9.4K
Institutions
1.5K
IBM Research - Thomas J. Watson Research Center
Yorktown Heights, United States
40 h-index
130 publications
8.5K citations
IMEC
Leuven, Belgium
38 h-index
411 publications
18K citations
KU Leuven
Leuven, Belgium
31 h-index
174 publications
7.4K citations
Chinese Academy of Sciences
Beijing, China
26 h-index
231 publications
11K citations
Centre National de la Recherche Scientifique
Paris, France
24 h-index
207 publications
5.1K citations
Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Paris, France
24 h-index
162 publications
6.2K citations
RCA (United States)
New York, United States
22 h-index
32 publications
7.1K citations
Stanford University
Stanford, United States
22 h-index
64 publications
3.8K citations
1–8 of 1.5K
Venues
- Journal of Applied Physics
386 publications · 21.5K citations
73
h-index
- Applied Physics Letters
349 publications · 17.6K citations
71
h-index
- IEEE Transactions on Electron Devices
163 publications · 8.8K citations
49
h-index
- IEEE Electron Device Letters
92 publications · 3.6K citations
35
h-index
- IEEE Transactions on Nuclear Science
65 publications · 3K citations
32
h-index
1–5