Microelectronics Reliability · 1998 · 18 citations · 8 references
EngineeringElectrical EngineeringPhysicsElectronic MaterialsPlasma PhysicsSemiconductor DevicesComplementary Metal-oxide-semiconductor TechnologyIon ImplantationLow-temperature PlasmasP-n JunctionsPlasma Surface TreatmentJunction BreakdownJunction FabricationPlasma Immersion Ion ImplantationShallow Junction FormationUltra-shallow Junction Engineering
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