Shallow Junction Formation

Shallow Junction Formation is a semiconductor fabrication process that belongs to the class of doping techniques in which dopant atoms are introduced into a silicon substrate via ion implantation to create highly localized, ultra-thin electrically active regions distinguished by their minimal depth and precise lateral control for advanced transistor performance.

319

Publications

8.8K

Citations

1.2K

Authors

246

Institutions

Publications per year

2017–2026

4

Authors

1.2K

  1. CM
    C. M. Osburn

    North Carolina State University, United States

    12 publications · 492 citations

    11

    h-index

  2. GA
    G. A. Rozgonyi

    North Carolina State University, United States

    7 publications · 389 citations

    7

    h-index

  3. ES
    Eddy Simoen

    IMEC, Belgium

    7 publications · 283 citations

    7

    h-index

  4. SB
    Susan B. Felch

    Varian Medical Systems (United States), United States

    7 publications · 181 citations

    7

    h-index

  5. TS
    T. Sarnet

    Centre National de la Recherche Scientifique, France

    6 publications · 143 citations

    6

    h-index

1–5 of 1.2K

Venues

  1. IEEE Transactions on Electron Devices

    32 publications · 1.2K citations

    22

    h-index

  2. Journal of Applied Physics

    30 publications · 1.4K citations

    20

    h-index

  3. Applied Physics Letters

    34 publications · 973 citations

    17

    h-index

  4. IEEE Electron Device Letters

    23 publications · 500 citations

    14

    h-index

  5. Journal of The Electrochemical Society

    JES · 13 publications · 326 citations

    13

    h-index

1–5