Shallow Junction Formation
Shallow Junction Formation is a semiconductor fabrication process that belongs to the class of doping techniques in which dopant atoms are introduced into a silicon substrate via ion implantation to create highly localized, ultra-thin electrically active regions distinguished by their minimal depth and precise lateral control for advanced transistor performance.
319
Publications
8.8K
Citations
1.2K
Authors
246
Institutions
Publications per year
2017–2026
4
Parents
319
Transient enhanced diffusion of boron in Si
Sachin Jain, Wim Schoenmaker, Richard Lindsay et al. · Journal of Applied Physics · 2002 · 233 citations
Germanium n-type shallow junction activation dependences
Chi On Chui, Leonard Kulig, Jean M. Moran et al. · Applied Physics Letters · 2005 · 177 citations
Mizuki Ono, M. Saito, T. Yoshitomi et al. · IEEE Transactions on Electron Devices · 1995 · 114 citations
1–5 of 319
1.2K
11
h-index
7
h-index
7
h-index
7
h-index
6
h-index
1–5 of 1.2K
246
North Carolina State University
Raleigh, United States
15 h-index
63 publications
2.9K citations
Hitachi (Japan)
Tokyo, Japan
14 h-index
71 publications
1.8K citations
IMEC
Leuven, Belgium
14 h-index
87 publications
4.2K citations

National Yang Ming Chiao Tung University
Hsinchu, Taiwan
12 h-index
49 publications
1.2K citations
NEC (Japan)
Tokyo, Japan
11 h-index
38 publications
814 citations
The University of Texas at Austin
Austin, United States
11 h-index
41 publications
1K citations

Varian Medical Systems (United States)
Palo Alto, United States
10 h-index
23 publications
590 citations
University of California, Berkeley
Berkeley, United States
10 h-index
30 publications
753 citations
1–8 of 246
32 publications · 1.2K citations
22
h-index
30 publications · 1.4K citations
20
h-index
34 publications · 973 citations
17
h-index
23 publications · 500 citations
14
h-index
JES · 13 publications · 326 citations
13
h-index
1–5