Statistics
Publications
37
Citations
1.7K
H-Index
22
Active since
1993
T. Yoshitomi is an author at Toshiba (Japan) specializing in engineering, electrical engineering, and semiconductor devices.
Publications per year
1993–2003
37
37
1.5 nm direct-tunneling gate oxide Si MOSFET's
H. Sasaki, Mizuki Ono, T. Yoshitomi et al. · IEEE Transactions on Electron Devices · 1996 · 346 citations
Mizuki Ono, M. Saito, T. Yoshitomi et al. · IEEE Transactions on Electron Devices · 1995 · 114 citations
H.S. Momose, Shigenari Nakamura, T. Ohguro et al. · IEEE Transactions on Electron Devices · 1998 · 106 citations
Engineering, Electrical Engineering, Manufacturing Engineering +17
Sub-50 nm gate length n-MOSFETs with 10 nm phosphorus source and drain junctions
Mizuki Ono, M. Saito, T. Yoshitomi et al. · 2002 · 105 citations
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