M. Koike

Analysis of resistance behavior in Ti- and Ni-salicided polysilicon films

T. Ohguro, S. Nakamura, M. Koike et al. · IEEE Transactions on Electron Devices · 1994 · 151 citations

Engineering, Electrical Engineering, Materials Science +10

<i>p</i>-type conduction in Mg-doped Ga0.91In0.09N grown by metalorganic vapor-phase epitaxy

S. Yamasaki, Seiji Asami, N. Shibata et al. · Applied Physics Letters · 1995 · 87 citations

Engineering, Materials Engineering, Materials Science +17

Electrical properties and microstructures of Pt/Ba0.5Sr0.5TiO3/SrRuO3 capacitors

Mitsuaki Izuha, Kazuhide Abe, M. Koike et al. · Applied Physics Letters · 1997 · 61 citations

Natural Sciences, Materials Engineering, Materials Science +17

Formation of strained-silicon layer on thin relaxed-SiGe/SiO 2 /Si structure using SIMOX technology

Naoharu Sugiyama, Tomohisa Mizuno, Shinichi Takagi et al. · Thin Solid Films · 2000 · 34 citations

Engineering, Materials Engineering, Materials Science +16

Depth resolution improvement in secondary ion mass spectrometry analysis using metal cluster complex ion bombardment

M. Tomita, T. Kinno, M. Koike et al. · Applied Physics Letters · 2006 · 31 citations

Natural Sciences, Chemistry, Materials Science +8