Microelectronics Reliability · 2003 · 30 citations · 4 references
Materials ScienceChip-scale PackageEngineeringAdvanced Packaging (Semiconductors)Mechanical BehaviorMechanical EngineeringMaterials CharacterizationMechanical BendingChip AttachmentSolid MechanicsElectronic PackagingMicroelectronicsMechanics Of Materials
4
Reliability characterization of the SLICC package
Pradeep Lall, Gerald Gold, Benjamin N. Miles et al. · 2002 · 12 citations
Solder-bumped Integrated Circuit, Engineering, Verification +20