Concepedia

Interconnect Characterization

Interconnect Characterization is a systematic method within interconnect technology that identifies, quantifies, and models the electrical, physical, and performance attributes of interconnect structures to evaluate their behavior and reliability under operational conditions.

704

Publications

26.8K

Citations

2.5K

Authors

495

Institutions

Publications per year

2017–2026

86

Parents

Publications

704

McPAT

Sheng Li, Jung Ho Ahn, Richard Strong et al. · 2009 · 2.4K citations

, , +17

Carbon nanotubes in interconnect applications

Franz Kreupl, Anthony Graham, Georg S. Duesberg et al. · Microelectronic Engineering · 2002 · 630 citations

, , +14

S-parameter-based IC interconnect transmission line characterization

W.R. Eisenstadt, Y. Eo · IEEE Transactions on Components Hybrids and Manufacturing Technology · 1992 · 627 citations

, , +16

A Multiparameter Moment-Matching Model-Reduction Approach for Generating Geometrically Parameterized Interconnect Performance Models

Luca Daniel, O.C. Siong, L.S. Chay et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2004 · 342 citations · Full text

, , +17

High-speed VLSI interconnect modeling based on S-parameter measurements

Y. Eo, W.R. Eisenstadt · IEEE Transactions on Components Hybrids and Manufacturing Technology · 1993 · 286 citations

, , +17

1–5 of 704

Authors

2.5K

  1. DS
    Dennis Sylvester

    University of Michigan, United States

    10 publications · 522 citations

    10

    h-index

  2. CV
    Carl V. Thompson

    Massachusetts Institute of Technology, United States

    10 publications · 330 citations

    10

    h-index

  3. PS
    Paul S. Ho

    The University of Texas at Austin, United States

    10 publications · 563 citations

    10

    h-index

  4. EZ
    Ehrenfried Zschech

    Technische Universität Dresden, Germany

    9 publications · 333 citations

    9

    h-index

  5. AD
    A. Deutsch

    IBM Research - Thomas J. Watson Research Center, United States

    9 publications · 395 citations

    9

    h-index

1–5 of 2.5K

Institutions

495

  1. IBM (United States)

    Armonk, United States

    23 h-index

    180 publications

    5.8K citations

  2. IBM Research - Thomas J. Watson Research Center

    Yorktown Heights, United States

    22 h-index

    112 publications

    5.2K citations

  3. IMEC

    Leuven, Belgium

    16 h-index

    176 publications

    6.1K citations

  4. Nanyang Technological University

    Singapore, Singapore

    16 h-index

    44 publications

    1.2K citations

  5. Intel (United States)

    Santa Clara, United States

    15 h-index

    60 publications

    1.6K citations

  6. Motorola (United States)

    Schaumburg, United States

    15 h-index

    57 publications

    2.4K citations

  7. Massachusetts Institute of Technology

    Cambridge, United States

    14 h-index

    49 publications

    2.6K citations

  8. Georgia Institute of Technology

    Atlanta, United States

    13 h-index

    42 publications

    1.9K citations

1–8 of 495

Venues

  1. Microelectronics Reliability

    36 publications · 922 citations

    20

    h-index

  2. Microelectronic Engineering

    22 publications · 1.3K citations

    16

    h-index

  3. Journal of Applied Physics

    19 publications · 992 citations

    16

    h-index

  4. 14

    h-index

  5. IEEE Transactions on Electron Devices

    14 publications · 823 citations

    13

    h-index

1–5