Y. Eo

S-parameter-based IC interconnect transmission line characterization

W.R. Eisenstadt, Y. Eo · IEEE Transactions on Components Hybrids and Manufacturing Technology · 1992 · 627 citations

Engineering, Electrical Engineering, Circuit Theory +16

High-speed VLSI interconnect modeling based on S-parameter measurements

Y. Eo, W.R. Eisenstadt · IEEE Transactions on Components Hybrids and Manufacturing Technology · 1993 · 286 citations

Engineering, Computer Engineering, Electrical Engineering +17

Interconnect capacitance, crosstalk, and signal delay for 0.35 μm CMOS technology

D.H. Cho, Y. Eo, Manho Seung et al. · 2002 · 37 citations

Engineering, Computer Engineering, Electrical Engineering +17

Silicon substrate coupling noise modeling, analysis, and experimental verification for mixed signal integrated circuit design

Y. Eo, Jong‐In Shim, W.R. Eisenstadt et al. · 2002 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +15

A Decoupling Technique for Efficient Timing Analysis of VLSI Interconnects With Dynamic Circuit Switching

Y. Eo, Seung‐Jun Shin, W.R. Eisenstadt et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2004 · 16 citations

Engineering, Computer Engineering, Electrical Engineering +17