Publication | Closed Access
Reliability characterization of the SLICC package
12
Citations
4
References
2002
Year
Unknown Venue
Solder-bumped Integrated CircuitEngineeringVerificationComputer ArchitectureSystem ReliabilityReliability EngineeringAdvanced Packaging (Semiconductors)Systems EngineeringElectronic PackagingReliability AnalysisReliability CharacterizationReliability3D Ic ArchitectureElectrical EngineeringChip On BoardComputer EngineeringChip AttachmentSlicc PackageMicroelectronicsChip-scale PackageReliability ModellingSoftware TestingSolder Bumps
SLICC (Slightly Larger than IC Carrier) is a chip-scale ball grid array (BGA) package currently under development at Motorola. The SLICC package consists of a solder-bumped integrated circuit (IC) which is flip-chip bonded to an interposer substrate-approximately 8 mils thick-and then underfilled with an encapsulant. Chip I/Os are routed to package I/Os through plated through holes (PTHs) in the interposer substrate. Package I/Os are composed of solder bumps (approx. 22.2 mils in diameter on a 32-mil pitch) attached to the bottom side of the interposer substrate. The most apparent benefit of the SLICC package is its utilization of the area efficiency associated with direct chip attach (DCA) technology, coupled with the assembly, test, and repair simplicity afforded by BGA-type packaging.
| Year | Citations | |
|---|---|---|
Page 1
Page 1