Superlattices and Microstructures · 2011 · 23 citations · 19 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportDevice ReliabilityDopingMetal-oxide-semiconductor Field-effect TransistorsSemiconductor Device MaterialsSemiconductor PhysicsChannel DopingChannel Doping EffectsGate Leakage CurrentGate Oxide DegradationGate Oxide LeakageHot-carrier DegradationLeakage Current Reduction
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SiGe-channel heterojunction p-MOSFET's
S. Verdonckt-Vandebroek, E.F. Crabbé, B.S. Meyerson et al. · IEEE Transactions on Electron Devices · 1994 · 245 citations