T.H. Ning

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Publications

Citations

4.8K

H-Index

Active since

1970

Affiliations

IBM Research - Thomas J. Watson Research Center(Current)

IBM (United States)

University of Illinois Urbana-Champaign

T.H. Ning is an author at IBM Research - Thomas J. Watson Research Center specializing in semiconductor devices, engineering, and electrical engineering.

Publications per year

1970–2016

Publications

Emission probability of hot electrons from silicon into silicon dioxide

T.H. Ning, C. M. Osburn, H.N. Yu · Journal of Applied Physics · 1977 · 292 citations

Engineering, Electrical Engineering, Materials Science +16

The scattering of electrons by surface oxide charges and by lattice vibrations at the silicon-silicon dioxide interface

C. T. Sah, T.H. Ning, Larry LeRoy Tschopp · Surface Science · 1972 · 264 citations

Natural Sciences, Materials Science, Physics +16

1 &#181;m MOSFET VLSI technology: Part IV&#8212;Hot-electron design constraints

T.H. Ning, Peter W. Cook, R.H. Dennard et al. · IEEE Transactions on Electron Devices · 1979 · 247 citations

Engineering, Computer Engineering, Electrical Engineering +17

Optically induced injection of hot electrons into SiO2

T.H. Ning, H.N. Yu · Journal of Applied Physics · 1974 · 234 citations

Engineering, Electrical Engineering, Materials Science +17

Effect of emitter contact on current gain of silicon bipolar devices

T.H. Ning, R. Isaac · IEEE Transactions on Electron Devices · 1980 · 219 citations

Engineering, Electrical Engineering, Materials Science +17

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