Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2011 · 31 citations · 16 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsSurface ScienceCurie TemperatureDefects In Electronic MaterialsBias Temperature InstabilityNegative Bias Temperature InstabilityPositive Bias Temperature InstabilityTemperature Instability
Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation B. Kaczer, T. Grasser, J. Franco, M. Toledano-Luque, Ph. J. Roussel, M. Cho, E. Simoen, G. Groeseneken; Recent trends in bias temperature instability. Journal of Vacuum Science & Technology B 1 January 2011; 29 (1): 01AB01. https://doi.org/10.1116/1.3521505 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAVS: Science & Technology of Materials Interfaces and ProcessingJournal of Vacuum Science & Technology B Search Advanced Search |Citation Search
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Asen Asenov, R. Balasubramaniam, A. R. Brown et al. · IEEE Transactions on Electron Devices · 2003 · 260 citations
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Engineering, Computer Engineering, Electrical Engineering +17