Solid-State Electronics · 2008 · 58 citations · 18 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice ScalingMetal-oxide-semiconductor Field-effect TransistorsShort-channel EffectsWide-bandgap Semiconductor DevicesDevice Scaling EffectsFin Field-effect Transistor ScalingFin Field-effect TransistorsGate LeakageGate Oxide LeakageJunction Leakage CurrentLeakageQuantum Tunneling Effects
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FinFET-a self-aligned double-gate MOSFET scalable to 20 nm
Chenming Hu, Jeffrey Bokor, Tsu‐Jae King et al. · IEEE Transactions on Electron Devices · 2000 · 1.6K citations
Engineering, Electrical Engineering, Electronic Materials +13
Jong‐Tae Park, J.-P. Colinge, C.H. Diaz · IEEE Electron Device Letters · 2001 · 256 citations
Engineering, Computer Engineering, Electrical Engineering +16