Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability

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Engineering, Computer Engineering, Electrical Engineering +14

High-performance CMOS variability in the 65-nm regime and beyond

K. Bernstein, D.J. Frank, Anne Gattiker et al. · IBM Journal of Research and Development · 2006 · 557 citations

Engineering, Computer Engineering, Electrical Engineering +17

Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS

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Engineering, Computer Engineering, Electrical Engineering +17

Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events

Rouwaida Kanj, Rajiv Joshi, Sani Nassif · 2006 · 344 citations

Engineering, Computer Engineering, Electrical Engineering +8

Charge trapping related threshold voltage instabilities in high permittivity gate dielectric stacks

Sufi Zafar, Alessandro Callegari, Evgeni Gusev et al. · Journal of Applied Physics · 2003 · 311 citations

Engineering, Electrical Engineering, Materials Science +17